■ 제품필수정보

제조사	Sick
제조사품명	WSE4-3P2130
간략설명	Sick Through Beam Photoelectric Sensor, Block Sensor, 0 ??4000 mm Detection Range

■ 제품사양

Sensor Style = Block Detection
타입 = Through Beam Detection Range = 0 ??4000 mm Output
타입 = PNP Switching Mode = Light Switching
시리즈 = WSE4 OverviewThe W4-3 family of photoelectric sensors offers best-in-class performance in a miniature housing design. Using the latest ASIC and PinPoint LED technologies, these sensors provide reliable object detection of transparent and glossy objects like blisters, e-cards and aluminium cans. Optical axes on the flat side enable simple, space-saving integration in machine environments - even without mounting brackets.At a glanceBest background suppression sensor in its class Universal use of PinPoint technology in all models BGS proximity sensor with laser-like light spot for precise detection tasks Reliable setting via 5-turn potentiometer, teach-in pushbutton, teach-in via cable or IO-Link Flexible sensor settings, monitoring, advanced diagnostics, and display thanks to IO-LinkYour BenefitsLow-cost integration due to optimal machine integration in areas with limited space Application versatility due to reliable detection of shiny or jet-black objects Rugged mounting system with M3 threaded metal inserts reduces maintenance costs due to a long service life High immunity to ambient light reduces downtime caused by false trips Clearly visible light spot simplifies alignment IO-Link provides easy data access from the PLC Quick and easy configuration Quick and easy integration using function blocksApplicationsReliable detection of irregularly shaped printed circuit boards. Checking of storage space occupancy Equidistant infeed of products Paper tear monitor Presence check for paper Detection of paper edges Leading edge detection and presence checking Sheet presence and punch monitoring Sheet presence and position monitoring Presence monitoring and counting process Collision awareness at the machining table Monitoring the material transportation Protrusion monitoring on the tray stack Level monitoring in the parts bunker Detection of solar wafers in harsh wafer production environments Detection of solar wafers in harsh cell production environments Detection, measurement, and positioning of the solar glass substrateNoteProduct details cover the whole product family. For details on the specifications for this individual product, please refer to the datasheet.